Digital.CSIC > Ciencia y Tecnologías Físicas > Instituto de Microelectrónica de Sevilla (IMS-CNM) > (IMS-CNM) Libros y partes de libros >




Open Access item BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits

Authors:Zjajo, Amir
Barragán, Manuel J.
Pineda de Gyvez, José
Issue Date:May-2007
Publisher:Institute of Electrical and Electronics Engineers
Citation:Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07: 1-6 (2007)
Abstract:This paper reports a new built-in self-test scheme for analog and mixed-signal devices based on die-level process monitoring. The objective of this test is not to replace traditional specification-based tests, but to provide a reliable method for early identification of excessive process parameter variations in production tests that allows quickly discarding of the faulty circuits. Additionally, the possibility of on-chip process deviation monitoring provides valuable information, which is used to guide the test and to allow the estimation of selected performance figures. The information obtained through guiding and monitoring process variations is re-used and supplement the circuit calibration.
Description:6 páginas, 10 figuras.
Publisher version (URL):http://dx.doi.org/10.1109/DATE.2007.364477
Appears in Collections:(IMS-CNM) Libros y partes de libros

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.