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(Some) Open problems to incorporate BIST in complex heterogeneous integrated systems

AuthorsBarragán, Manuel J. ; Huertas, Gloria ; Rueda, Adoración ; Huertas-Díaz, J. L.
Issue DateJan-2010
PublisherInstitute of Electrical and Electronics Engineers
CitationFifth IEEE International Symposium on Electronic Design, Test and Application: 8-13 (2010-DELTA'10)
AbstractThis paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex integrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.
DescriptionComunicación presentada al DELTA 10 celebrado en Ho Chi Minh City del 13 al 15 de Enero del 2010.
Publisher version (URL)http://dx.doi.org/10.1109/DELTA.2010.67
Appears in Collections:(IMSE-CNM) Libros y partes de libros
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