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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/30664
Title: (Some) Open problems to incorporate BIST in complex heterogeneous integrated systems
Authors: Barragán, Manuel J. ; Huertas, Gloria ; Rueda, Adoración ; Huertas-Díaz, J. L.
Issue Date: Jan-2010
Publisher: Institute of Electrical and Electronics Engineers
Citation: Fifth IEEE International Symposium on Electronic Design, Test and Application: 8-13 (2010-DELTA'10)
Abstract: This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex integrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.
Description: Comunicación presentada al DELTA 10 celebrado en Ho Chi Minh City del 13 al 15 de Enero del 2010.
Publisher version (URL): http://dx.doi.org/10.1109/DELTA.2010.67
URI: http://hdl.handle.net/10261/30664
DOI: 10.1109/DELTA.2010.67
ISBN: 978-0-7695-3978-2
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