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Open Access item (Some) Open problems to incorporate BIST in complex heterogeneous integrated systems

Authors:Barragán, Manuel J.
Huertas, Gloria
Rueda, Adoración
Huertas-Díaz, J. L.
Issue Date:Jan-2010
Publisher:Institute of Electrical and Electronics Engineers
Citation:Fifth IEEE International Symposium on Electronic Design, Test and Application: 8-13 (2010-DELTA'10)
Abstract:This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex integrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.
Description:Comunicación presentada al DELTA 10 celebrado en Ho Chi Minh City del 13 al 15 de Enero del 2010.
Publisher version (URL):http://dx.doi.org/10.1109/DELTA.2010.67
URI:http://hdl.handle.net/10261/30664
ISBN:978-0-7695-3978-2
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Appears in Collections:(IMS-CNM) Libros y partes de libros

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