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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/30652
Title: Low-cost signature test of RF blocks based on envelope response analysis
Authors: Barragán, Manuel J. ; Fiorelli, R. ; Vázquez, Diego ; Rueda, Adoración ; Huertas-Díaz, J. L.
Keywords: RF BIST
RF test
Signature test
Issue Date: May-2010
Publisher: Institute of Electrical and Electronics Engineers
Citation: 15th IEEE European Test Symposium (ETS): 55-60 (2010)
Abstract: This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and analysis of the two-tone response envelope of the device under test (DUT). The response envelope is processed to obtain a simple digital signature sensitive to key specifications of the DUT. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
Description: Comunicación presentada al "15th ETS-2010" celebrado en Praga (República Checa) del 24 al 28 de Mayo del 2010.
Publisher version (URL): http://dx.doi.org/10.1109/ETSYM.2010.5512780
URI: http://hdl.handle.net/10261/30652
DOI: 10.1109/ETSYM.2010.5512780
ISBN: 978-1-4244-5833-2
Appears in Collections:(IMS-CNM) Libros y partes de libros
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