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Título : Low-cost signature test of RF blocks based on envelope response analysis
Autor : Barragán, Manuel J., Fiorelli, R., Vázquez, Diego, Rueda, Adoración, Huertas-Díaz, J. L.
Palabras clave : RF BIST
RF test
Signature test
Fecha de publicación : May-2010
Editor: Institute of Electrical and Electronics Engineers
Citación : 15th IEEE European Test Symposium (ETS): 55-60 (2010)
Resumen: This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and analysis of the two-tone response envelope of the device under test (DUT). The response envelope is processed to obtain a simple digital signature sensitive to key specifications of the DUT. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
Descripción : Comunicación presentada al "15th ETS-2010" celebrado en Praga (República Checa) del 24 al 28 de Mayo del 2010.
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ISBN : 978-1-4244-5833-2
DOI: 10.1109/ETSYM.2010.5512780
Appears in Collections:(IMS-CNM) Libros y partes de libros

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