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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/30419
Title: A fast and exact modulo-distance between histograms
Authors: Serratosa, Francesc; Sanfeliu, Alberto
Keywords: Pattern recognition
Pattern recognition systems
Issue Date: 2006
Publisher: Springer
Citation: Structural, Syntactic, and Statistical Pattern Recognition: 394-402 (2006)
Series/Report no.: Lecture Notes in Computer Science 4109
Abstract: The aim of this paper is to present a new method to compare modulo histograms. In these histograms, the type of elements are cyclic, for instance, the hue in colour images. The main advantage is that there is an important time-complexity reduction respect the methods presented before. The distance between histograms that we present is defined on a structure called signature, which is a lossless representation of histograms. We show that the computational cost of our distance is O(z'2), being z' the number of non-empty bins of the histograms. The computational cost of the algorithms presented in the literature depends on the number of bins of the histograms. In most of the applications, the obtained histograms are sparse, then considering only the non-empty bins makes the time consuming of the comparison drastically decrease. The distance and algorithms presented in this paper are experimentally validated on the comparison of images obtained from public databases.
Description: Presentado al 11th Joint IAPR International Workshop on Structural, Syntactic and Statistical Pattern Recognition (SSPR&SPR/2006) celebrado en Hong Kong (China).
Publisher version (URL): http://dx.doi.org/10.1007/11815921_43
URI: http://hdl.handle.net/10261/30419
DOI: 10.1007/11815921_43
ISBN: 978-3-540-37236-3
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