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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/30188
Title: Low cost architecture for structure measure distance computation
Authors: Aranda López, Juan; Climent Vilaro, Juan; Grau Saldes, Antoni; Sanfeliu Cortés, Alberto
Keywords: [INSPEC] Pattern recognition
Issue Date: 1998
Publisher: Institute of Electrical and Electronics Engineers
Citation: J. Aranda, J. Climent, A. Grau and A. Sanfeliu. Low cost architecture for structure measure distance computation, 14th International Conference on Pattern Recognition, 1998, Brisbane, Australia, pp. 1592-1594, IEEE.
Abstract: Huge and expensive computation resources are usually required to perform graph labelling at high speed. This fact restricts an extensive use of this methodology in industrial applications such as visual inspection. A new systolic architecture is presented which computes structural distances between cliques of different graphs based on a modified incremental Levenshtein distance algorithm. The distances obtained are used as a support function for graph labelling using probabilistic relaxation techniques. The proposed architecture computes the distances between k input cliques of an input graph and one reference clique of a reference graph. It does not limit the number of cliques nor cliques complexity of the input graph, so any input graph can be labelled. A low cost solution has been implemented based on FPGAs.
URI: http://hdl.handle.net/10261/30188
DOI: http://dx.doi.org/10.1109/ICPR.1998.712017
Appears in Collections:(IRII) Comunicaciones congresos
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