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	Derechos	Fecha Public.	Título	Autor(es)	Tipo
1	openAccess	may-2010	Analysis of Excess Carrier Concentration Control in Fast-Recovery High Power Bipolar Diodes at Low Current Densities	Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Vobecky, J.; Mestres, Narcís CSIC ORCID	artículo
2	openAccess	dic-2004	Heat power source controller circuit	Madrid, Francesc CSIC; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Godignon, Philippe	artículo
3	closedAccess	nov-2010	Low-cost trench isolation technique for reverse blocking IGBT using boron nitride doping wafers	Vellvehi Hernández, Miquel; Gálvez Sánchez, José Luis CSIC ORCID; Perpiñá Giribet, Xavier; Jordà, Xavier; Godignon, Philippe; Millán, José	artículo
4	closedAccess	2004	Internal infrared laser deflection system: a tool for power device characterization	Perpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José; Kiedrowski, H. von	artículo
5	closedAccess	ago-2008	Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflection	Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J.; Mestres, Narcís CSIC ORCID	artículo
6	closedAccess	dic-2006	Transmission Fabry–Pérot interference thermometry for thermal characterization of microelectronic devices	Perpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID	artículo
7	openAccess	14-ago-2021	Direct Visualization of Anti-Ferroelectric Switching Dynamics via Electrocaloric Imaging	Vales-Castro, Pablo CSIC ORCID; Vellvehi Hernández, Miquel; Perpiñá Giribet, Xavier; Caicedo Jose Manuel; Jordà, Xavier; Faye, Romain; Roleder, Krystian; Kajewski, Dariusz; Pérez-Tomás, Amador CSIC ORCID; Defay, Emmanuel; Catalán, Gustau CSIC ORCID	artículo
8	closedAccess	ene-2009	Laser beam deflection-based perimeter scanning of integrated circuits for local overheating location	Perpiñà, X.; Jordà, Xavier; Altet, J.; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID	artículo
9	closedAccess	oct-2008	Hot-Spot Detection in Integrated Circuits by Substrate Heat-Flux Sensing	Perpiñà, X.; Altet, J.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Mestres, Narcís CSIC ORCID	artículo
10	closedAccess	dic-2008	Power-Substrate Static Thermal Characterization Based on a Test Chip	Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; Coleto, J.	artículo
11	openAccess	20-feb-2017	A New Vertical JFET Power Device for Harsh Radiation Environments	Fernández-Martínez, Pablo; Flores, David; Hidalgo, Salvador ; Jordà, Xavier; Perpiñá Giribet, Xavier; Quirion, David; Ré, Lucía; Ullán Comes, Miguel ; Vellvehi Hernández, Miquel	artículo
12	openAccess	2005	Development of an analog processing circuit for IR-radiation power and noncontact position measurements	Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José	artículo
13	closedAccess	jul-2011	SiC Schottky Diodes for Harsh Environment Space Applications	Godignon, Philippe; Jordà, Xavier; Vellvehi Hernández, Miquel; Perpiñà, X.; Banu, Viorel; López, Demetrio; Barbero, Juan; Brosselard, P.; Massetti, Silvia	artículo
14	closedAccess	jul-2011	Low-cost and versatile thermal test chip for power assemblies assessment and thermometric calibration purposes	Jordà, Xavier; Perpiñá Giribet, Xavier; Vellvehi Hernández, Miquel; Madrid, Francesc CSIC; Flores, David; Hidalgo, Salvador ; Millán, José	artículo
15	openAccess	12-dic-2009	Reduced-Order Thermal Behavioral Model Based on Diffusive Representation	Allard, Bruno; Jordà, Xavier; Perpiñà, X.; Vellvehi Hernández, Miquel; M’Rad, Sabrine	artículo
16	openAccess	sep-2005	Thermal calibration procedure for internal infrared laser deflection apparatus	Perpiñà, X.; Jordà, Xavier; Madrid, Francesc CSIC; Flores, David; Hidalgo, Salvador ; Vellvehi Hernández, Miquel; Mestres, Narcís CSIC ORCID	artículo
17	closedAccess	oct-2004	Self-heating experimental study of 600 V PT-IGBTs under low dissipation energies	Perpiñà, X.; Jordà, Xavier; Mestres, Narcís CSIC ORCID ; Vellvehi Hernández, Miquel; Godignon, Philippe; Millán, José	artículo
18	openAccess	2011	Hot spot analysis in integrated circuit substrates by laser mirage effect	Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Altet, J.	artículo
19	closedAccess	2008	A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits	Altet, J.; Aldrete Vidrio, E.; Mateo, D.; Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Millán, José; Salhi, A.; Grauby, Stéphane; Claeys, W.; Dilhaire, S.	artículo
20	closedAccess	jul-2011	Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems	Perpiñà, X.; Jordà, Xavier; Vellvehi Hernández, Miquel; Rebollo, J.; Mermet-Guyennet, M.	artículo