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Título: | Submonolayer sensitivity of InSb on InP determined by friction-force microscopy |
Autor: | Tamayo de Miguel, Francisco Javier CSIC ORCID; García García, Ricardo CSIC ORCID; Utzmeier, Thomas CSIC; Briones Fernández-Pola, Fernando CSIC | Palabras clave: | MBE InSb InP AFM |
Fecha de publicación: | 1997 | Editor: | American Physical Society | Citación: | Physical Review B Condensed Matter and Materials Physics 55(20): 1-4 (1997) | Resumen: | Using molecular-beam-epitaxy-grown InAs and InSb on InP(001) surfaces, we show that the friction-force microscope is sensitive to monolayer coverage. Those surfaces are characterized by three-dimensional islands separated by flat regions. For a constant load, the frictional forces measured on the InAs island and on the substrate are the same. This is due to the formation of a two-dimensional wetting layer (1.5 ML) of InAs covering the InP(001). The frictional force is controlled by the interaction of this layer and the tip. In contrast, the deposition of 2 ML of InSb on InP(001) produces a different behavior. The frictional force changes when the tip moves from the island to the flat region. Photoluminescence and atomic-force-microscopy experiments show the formation of an InSb submonolayer. The sensitivity of the friction-force microscope to monolayer coverage illustrates its usefulness for wetting-layer analysis. Based on these results we discuss the potential of the friction-force microscope to develop a spatially resolved friction spectroscopy. | Versión del editor: | http://dx.doi.org/10.1103/PhysRevB.55.R13436 | URI: | http://hdl.handle.net/10261/27406 | DOI: | 10.1103/PhysRevB.55.R13436 | ISSN: | 1098-0121 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
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submonolayer.pdf | 179,26 kB | Adobe PDF | Visualizar/Abrir |
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