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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/27212
Title: Adhesion hysteresis in dynamic atomic force microscopy
Authors: Köber, Mariana; Sahagún, Enrique; Fuss, Martina; Briones Fernández-Pola, Fernando; Luna, Mónica; Sáenz, J. J.
Keywords: AFM
Issue Date: 2-May-2008
Publisher: Wiley-VCH
Citation: Physica Statatus Solidi (RRL) 2, No. 3, 138–140 (2008)
Abstract: The effects of adhesion hysteresis in the dynamic-dissipation curves measured in amplitude-modulation atomic force microscopy are discussed. Hysteresis in the interaction forces is shown to modify the dynamics of the cantilever leading to different power dissipation curves in the repulsive and attractive regimes. Experimental results together with numerical simulations show that power dissipation, as measured in force microscopy, is not always proportional to the energy dissipated in the tip–sample interaction process.
Publisher version (URL): http://dx.doi.org/10.1002/pssr.200802033
URI: http://hdl.handle.net/10261/27212
ISSN: 1862-6254
DOI: 10.1002/pssr.200802033
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