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Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/25350
Title: Grazing-incidence diffraction anomalous fine structure of InAs/InP(001) self-assembled quantum wires
Authors: Grenier, S.; Proietti, M. G.; Renevier, H.; González Sotos, Luisa; García Martínez, Jorge Manuel; García, J.
Keywords: Surfaces
Thin films
Low-D systems
Issue Date: 15-Feb-2002
Publisher: EDP Sciences
Citation: Europhysics Letters, 57, 4 (2002)
Abstract: We have studied nanostructured samples of InAs/InP(001) by means of Grazing Incidence Diffraction Anomalous Fine Structure. The samples, grown by molecular beam epitaxy, show a periodic corrugation on the surface giving rise to an array of self-assembled quantum wires after deposition of 2.5 monolayers of InAs. We measured the (440) and (420) GIDAFS spectra, at the As K-edge, at incidence and outgoing angles close to the substrate's critical angle. We analysed the anomalous diffraction lineshapes vs. the energy, as well as the oscillatory part of the signal in the extended region above the edge and obtained, for the first time, information about composition and strain inside the quantum wires and close to the interface. Our results suggest possible interfaces.
Description: 7 páginas, 5 figuras, 1 tabla.-- PACS: 61.10.-i – X-ray diffraction and scattering. 61.10.Ht – X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc. 68.65.-k – Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties.
Publisher version (URL): http://dx.doi.org/ 10.1209/epl/i2002-00489-5
URI: http://hdl.handle.net/10261/25350
ISSN: 0295-5075
DOI: 10.1209/epl/i2002-00489-5
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