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Title

Hot electrons in a nanowire hard X-ray detector

AuthorsZapf, Maximiliam; Ritzer, Maurizio; Liborius, Lisa; Johannes, Andreas; Hafermann, Martin; Schönherr, Sven; Segura-Ruiz, Jaime; Martínez-Criado, Gema ; Prost, Werner; Ronning, Carsten
Issue Date11-Dec- 15
PublisherNature Publishing Group
CitationNature Communications 11 (2020)
AbstractNanowire chip-based electrical and optical devices such as biochemical sensors, physical detectors, or light emitters combine outstanding functionality with a small footprint, reducing expensive material and energy consumption. The core functionality of many nanowire-based devices is embedded in their p-n junctions. To fully unleash their potential, such nanowire-based devices require – besides a high performance – stability and reliability. Here, we report on an axial p-n junction GaAs nanowire X-ray detector that enables ultra-high spatial resolution (~200 nm) compared to micron scale conventional ones. In-operando X-ray analytical techniques based on a focused synchrotron X-ray nanobeam allow probing the internal electrical field and observing hot electron effects at the nanoscale. Finally, we study device stability and find a selective hot electron induced oxidization in the n-doped segment of the p-n junction. Our findings demonstrate capabilities and limitations of p-n junction nanowires, providing insight for further improvement and eventual integration into on-chip devices.
Publisher version (URL)http://dx.doi.org/10.1038/s41467-020-18384-x
URIhttp://hdl.handle.net/10261/236986
Identifiersdoi: 10.1038/s41467-020-18384-x
issn: 2041-1723
Appears in Collections:(ICMM) Artículos
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