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dc.contributor.authorGarcía Martínez, Jorge Manuel-
dc.contributor.authorHe, Rui-
dc.contributor.authorJiang, Mason P.-
dc.contributor.authorYanb, Jun-
dc.contributor.authorPinczuk, Aron-
dc.contributor.authorZuev, Yuri M.-
dc.contributor.authorKimb, Keun Soo-
dc.contributor.authorKim, Philip-
dc.contributor.authorBaldwin, Kirk-
dc.contributor.authorWest, Ken W.-
dc.contributor.authorPfeiffer, Loren N.-
dc.date.accessioned2010-03-16T08:18:47Z-
dc.date.available2010-03-16T08:18:47Z-
dc.date.issued2010-03-07-
dc.identifier.citationSolid State Communication 150 (17-18): 809-811 (2010)en_US
dc.identifier.issn0038-1098-
dc.identifier.urihttp://hdl.handle.net/10261/22407-
dc.description.abstractFew-layer graphene films are grown using a Molecular Beam Deposition (MBD) technique in ultra-high vacuum by evaporation of atomic carbon and subsequent annealing of the samples at 800–900 °C. The graded thickness layers are grown on strip-shaped oxidized silicon substrates which are covered with 300 nm thick nickel films deposited by e-beam evaporation. The thickness of the deposited carbon layers changes continuously from 70 Å to less than 4 Å. The relatively narrow optical phonon bands in Raman spectroscopy reveal that good quality multilayer graphene films form on the Ni surface.en_US
dc.description.sponsorshipThis work is supported by ONR (N000140610138 and Graphene Muri), NSF (CHE-0117752 and CHE-0641523),NYSTAR, Spanish CAM (Q&C Light, S2009ESP-1503), Spanish MICINN (NANINPHO-QD, TEC2008-06756-C03- 01, CONSOLIDER QOIT and Salvador de Madariaga Grant no. PR2007-0036).en_US
dc.format.extent914806 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherElsevieren_US
dc.rightsopenAccessen_US
dc.subjectGrapheneen_US
dc.subjectCrystal growthen_US
dc.subjectInelastic light scatteringen_US
dc.titleMultilayer graphene films grown by Molecular Beam Depositionen_US
dc.typeartículoen_US
dc.identifier.doi10.1016/j.ssc.2010.02.029-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.ssc.2010.02.029en_US
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.openairetypeartículo-
item.grantfulltextopen-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
item.languageiso639-1en-
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