On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C

Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/217670

COMPARTIR / EXPORTAR:

SHARE BASE	Comparte tu historia de Acceso Abierto
Visualizar otros formatos: MARC \| Dublin Core \| RDF \| ORE \| MODS \| METS \| DIDL \| DATACITE
Refman EndNote Bibtex RefWorks Excel CSV PDF DataCite Send via email

Título:	On the wavelength dependence of the AE33 aethalometer multiple scattering correction factor C
Autor:	Yus-Díez, Jesús CSIC ORCID; Bernardoni, V.; Pandolfi, Marco CSIC ORCID; Alastuey, Andrés CSIC ORCID; Querol, Xavier CSIC ORCID ; Ciniglia, Davide; Močnik, G.; Vecchi, R.
Palabras clave:	Aerosols Aethalometer
Fecha de publicación:	sep-2020
Citación:	European Aerosol Conference (EAC) 2020
Resumen:	The Aethalometer (AE; Magee Scientific) is a widely used filter-based instrument that provides in-situ realtime optical measurements of light absorbing aerosols in 7 different wavelengths ranging from 370nm to 950nm. As for any other filter-based technique, Aethalometer measurements are affected by two artefacts: the multiple-scattering effects caused by the scattering of sampling light by both the filter fibres and the aerosol particles on the filter (C(l) in Eq. 1) and the loading effect due to the saturation of the measurement as a function of deposited particles (RATN(l) in Eq. 1).
URI:	http://hdl.handle.net/10261/217670
Aparece en las colecciones:	(IDAEA) Comunicaciones congresos