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Electronic signature of MnAs phases in bare and buried films grown on GaAs(001)

AuthorsMoreno, M. ; Kumar, A.; Tallarida, M.; Ney, A.; Ploog, K. H.
KeywordsArsenic alloys
Ferromagnetic materials
Gallium arsenide
III-V semiconductors
Magnetic thin films
Manganese alloys
Issue Date15-Aug-2008
PublisherAmerican Vacuum Society
CitationJournal of Vacuum Science and Technology - Section B 26(4): 1530-1533 (2008)
AbstractPhotoelectron emission spectroscopy analyses of the arsenic bonding in the near-surface region of an initially arsenic-capped MnAs (100) film grown on GaAs(001) have been carried out for progressive thermal decapping stages. Electronically distinct As-bonding states are identified and assigned to bulk MnAs phases, bulk arsenic, and interfacial environments. The arsenic coating imposes mechanical constraints to the MnAs film, in addition to those imposed by the GaAs substrate, which appear to alter the relative stability of the and MnAs phases around room temperature.
Description4 pages.-- PACS: 68.55.A-; 75.70.Cn; 75.50.Cc; 79.60.-i; 82.80.Pv; 71.20.Gj
Publisher version (URL)http://dx.doi.org/10.1116/1.2957614
Appears in Collections:(ICMM) Artículos
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