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Determination of texture by infrared spectroscopy in titanium oxide–anatase thin films

AuthorsPecharromán, Carlos ; Gracía, Francisco; Holgado, Juan P. ; Ocaña, Manuel ; González-Elipe, Agustín R. ; Bassas, J.; Santiso, José ; Figueras, Albert
KeywordsTitanium compounds
Infrared spectra
X-ray diffraction
Dielectric thin films
Issue Date15-Apr-2003
PublisherAmerican Institute of Physics
CitationJournal of Applied Physics 93(8): 4634 (2003)
AbstractA theoretical model to determine the effective dielectric tensor of heterogeneous materials composed by anisotropic microcrystallites has been introduced to explain the infrared spectral features of textured thin films of uniaxial materials as the function of a textural parameter. This theoretical treatment is able to satisfactorily reproduce the experimental absorbance spectra of TiO2–anatase thin films chosen as a model system. Comparison of texture data obtained from infrared spectroscopy and x-ray diffraction are in good agreement which support the validity of the proposed model.
Description12 pages, 6 figures, 4 tables, 2 appendix.-- PACS: 68.55.Jk; 78.66.Nk; 78.30.Hv
Publisher version (URL)http://dx.doi.org/10.1063/1.1560858
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