Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/21604
Share/Export:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE
Title

Identification of ternary boron–carbon–nitrogen hexagonal phases by x-ray absorption spectroscopy

AuthorsGago, Raúl CSIC ORCID; Jiménez Guerrero, Ignacio CSIC ORCID; Albella, J. M. CSIC; Terminello, Louis J.
KeywordsBoron compounds
XANES
Semiconductor thin films
Semiconductor materials
Issue Date28-May-2001
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 78(22): 3430 (2001)
AbstractBoron carbon nitride (BCN) films have been grown by B4C evaporation with concurrent N ion assistance, and have been characterized by x-ray absorption near edge (XANES) spectroscopy. Upon the nitrogen insertion, the film structure evolves from BxC-like to h-BN-like. The hexagonal structure corresponds to a true ternary BCN compound that can be understood as h-BN with carbon incorporated in substitutional sites. The C(1s)XANES presents (pi*) states characteristic of the BCN arrangement. The basal planes of the h-BCN phase are oriented perpendicular to the substrate, as derived from the angle dependence of the XANES signal.
Description3 pages, 3 figures.-- PACS: 68.55.Nq; 61.10.Ht; 78.70.Dm
Publisher version (URL)http://dx.doi.org/10.1063/1.1376428
URIhttp://hdl.handle.net/10261/21604
DOI10.1063/1.1376428
ISSN0003-6951
Appears in Collections:(ICMM) Artículos




Files in This Item:
File Description SizeFormat
ternary boron.pdf55,61 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work

SCOPUSTM   
Citations

47
checked on May 22, 2022

WEB OF SCIENCETM
Citations

49
checked on May 19, 2022

Page view(s)

350
checked on May 25, 2022

Download(s)

302
checked on May 25, 2022

Google ScholarTM

Check

Altmetric

Dimensions


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.