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Molecular dynamics and microstructure development during cold crystallization in poly(ether-ether-ketone) as revealed by real time dielectric and x-ray methods

AuthorsNogales, Aurora ; Ezquerra, Tiberio A. ; Denchev, Zlatan; Sics, Igors; Baltá Calleja, Francisco José ; Hsiao, Benjamin S.
X-ray scattering
Dielectric relaxation
Issue Date22-Aug-2001
PublisherAmerican Institute of Physics
CitationJournal of Chemical Physics 115(8): 3804 (2001)
AbstractThe isothermal crystallization process of poly(ether-ether-ketone) from the glass has been studied in real time by dielectric spectroscopy and x-ray scattering experiments. The combination of these two techniques revealed a complete picture of the crystallization processes from the point of view of both amorphous and crystalline phases. Analysis of results shows that the sample morphology consists of lamellar stacks, separated by rather broad amorphous regions. The lamellar stacks are highly crystalline (~70%), as obtained from both dielectric and x-ray scattering measurements, and the amorphous phase within the stacks is constrained up to a level where no segmental relaxation is possible. The remaining amorphous phase, after completion of the primary crystallization process, still has a certain mobility, but it is significantly slower than the initial amorphous mobility. Dielectric data and x-ray results are found to be highly congruent.
Description10 pages, 9 figures.-- PACS: 64.70.Dv; 81.10.-h; 78.70.Ck; 77.22.Gm
Publisher version (URL)http://dx.doi.org/10.1063/1.1388627
Appears in Collections:(CFMAC-IEM) Artículos
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