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Título:	DEPFET pixel detector in the Belle II experiment
Autor:	Abudinen, F.; Boronat Arévalo, Marçà CSIC ORCID; Esperante Pereira, Daniel CSIC ORCID; Fuster, Juan CSIC ORCID; Gomis, P.; Lacasta Llácer, Carlos CSIC ORCID ; Moya, David CSIC; Sánchez, J. G.; Vila, Iván CSIC ORCID; López Virto, A. CSIC ORCID ; Vos, Marcel CSIC ORCID
Palabras clave:	Solid state detectors—poster session Tracking detectors Pixel detectors Silicon detectors DEPFET Belle II
Fecha de publicación:	2019
Editor:	Elsevier
Citación:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 936: 657-659 (2019)
Resumen:	The Belle II experiment will run with a reduced beam asymmetry and a factor of 40 higher instantaneous luminosity compared to the Belle experiment. To cope with this and to be able to perform high precision vertex measurements for charge conjugation parity violating processes, a pixel detector based on DEPFET technology will be installed in the center of Belle II. Its basic properties and the DAQ chain are presented in this article.
Descripción:	Belle II DEPFET and PXD Collaboration: et al.
Versión del editor:	https://doi.org/10.1016/j.nima.2018.10.048
URI:	http://hdl.handle.net/10261/213112
DOI:	10.1016/j.nima.2018.10.048
Identificadores:	doi: 10.1016/j.nima.2018.10.048 issn: 0168-9002
Aparece en las colecciones:	(IFCA) Artículos (IFIC) Artículos

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DEPFET pixel detector in the Belle II experiment