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Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers

AuthorsSics, Igors; Nogales, Aurora ; Ezquerra, Tiberio A. ; Denchev, Zlatan; Baltá Calleja, Francisco José ; Meyer, A.; Döhrmann, R.
Issue DateApr-2000
PublisherAmerican Institute of Physics
CitationReview of Scientific Instruments 71(4): 1733 (2000)
AbstractA novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy (SWD). The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly(ethylene terephthalate). By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science.
Description4 pages, 6 figures.
Publisher version (URL)http://dx.doi.org/10.1063/1.1150528
Appears in Collections:(CFMAC-IEM) Artículos
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