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Lithography-free electrical transport measurements on 2D materials by direct microprobing

AuthorsGant, Patricia; Niu, Yue; Svatek, Simon A.; Agraït, Nicolás; Munuera, C. ; García-Hernández, M. ; Frisenda, Riccardo; Pérez de Lara, David; Castellanos-Gómez, Andrés
Issue Date21-Nov-2017
PublisherRoyal Society of Chemistry (UK)
CitationJournal of Materials Chemistry C 5(43): 11252-11258 (2017)
AbstractWe present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.
Publisher version (URL)http://doi.org/10.1039/C7TC01203A
Identifiersdoi: 10.1039/c7tc01203a
issn: 2050-7526
Appears in Collections:(ICMM) Artículos
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