English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/186364
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

Title

Effect of x-ray irradiation on Co-phthalocyanine thin films studied by surface plasmon resonance

AuthorsSerrano Rubio, Aída ; Rodríguez de la Fuente, O.; Monton, C.; Muñoz-Noval, A. ; Valmianski, I.; Fernández Lozano, José Francisco ; Castro, Germán R. ; Schuller, I. K.; García García-Tuñón, Miguel Ángel
KeywordsRefractive index
Surface plasmons
x-ray irradiation
Co-phthalocyanine thin films
Issue Date23-Feb-2016
PublisherIOP Publishing
CitationJournal of Physics D - Applied Physics 49(12): 125503 (2016)
AbstractWe explore here the effect of x-ray irradiation (7.7 keV) on Co-phthalocyanine (CoPc) thin films using surface plasmon resonance (SPR). We have found a small and partially reversible modification of the SPR spectra of CoPc in CoPc/Au bilayers upon irradiation. For a beam intensity of ∼10 photons • s • mm and an irradiation time of the order of 1 h, we estimate small variations of the order of ∼1-5% in the refractive index associated with the scattering of the x-rays with the soft matter. A Raman study of the irradiated regions did not show structural modifications, suggesting that the observed variations in the optical properties of the CoPc films are related to modifications of their electronic configuration.
Publisher version (URL)https://doi.org/10.1088/0022-3727/49/12/125503
URIhttp://hdl.handle.net/10261/186364
Identifiersdoi: 10.1088/0022-3727/49/12/125503
e-issn: 1361-6463
issn: 0022-3727
Appears in Collections:(ICMM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.