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Bulk characterization in a Monte Carlo particle-deposition model with a novel adherence-potential barrier

AuthorsGalindo, Jose Luis; Huertas, Rafael; Carrasco-Sanz, Ana; Lapresta, Alejandro; Galindo, Jorge; Vasco Matías, Enrique
Issue Date21-Jul-2016
PublisherAmerican Institute of Physics
CitationJournal of Applied Physics 120(3): 034902 (2016)
AbstractThe aim of this work is to analyze in more depth a model of particle deposition by characterizing different parameters such as profile density, bonds and perimeter, and substrate coverage, all being involved in the description of deposits as bulk. Thus, this study is an extension of a previous work on non-equilibrium interface-growth systems where two different interface-growth models, called Standard Adherence Rule Model and Potential Adherence Rule Model, were characterized. In this work, bulk characterization is implemented for the complete range of Peclet numbers. The zones of density profile (Near-Wall, Plateau, and Active-Growth) are studied by proposing an adjustment for each of them and determining the full-setting density profile depending on the Peclet number. The density profiles are compared with other one- and two-stage models. Furthermore, an algorithm is proposed to calculate the number of bonds of the particles and the perimeter that a substrate forms over time. Finally, to analyze the coating, its temporal behavior is adjusted to an exponential function by comparing the results with those found for Random Sequential Adsorption models which describe systems like colloidal particles on solid substrates, adsorption of proteins at mineral surfaces, or oxidation of one-dimensional polymer chains.
Publisher version (URL)https://doi.org/10.1063/1.4956431
Identifiersdoi: 10.1063/1.4956431
e-issn: 1089-7550
issn: 0021-8979
Appears in Collections:(ICMM) Artículos
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