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Título : Secondary electron emission and photoemission studies on surface films of carbon nitride
Autor : Ripalda, José María, Montero, I., Vázquez, Luis, Raboso, D., Galán, L.
Palabras clave : Fullerenes
Graphite
Diamond-like carbon
Nitrogen
Thin films
Secondary electron emission
Photoelectron spectra
Ion-surface impact
Fecha de publicación : 24-Feb-2006
Editor: American Institute of Physics
Citación : Journal of Applied Physics 99, 043513 (2006)
Resumen: The secondary electron emission yield of fullerene, graphite, and diamondlike carbon after low-energy N2+ ion bombardment was studied for antimultipactor applications. Nitrogen incorporation into the carbon thin films decreases their secondary emission yield, contrary to the hydrogen or oxygen effect. Carbon nitride surface textured to a nanometric scale had the property of hindering secondary electron emission. Valence bands obtained from photoemission spectroscopy using synchrotron radiation were correlated with secondary electron emission measurements. Multipactor threshold power for carbon nitride was 7.5 kW.
Versión del editor: http://link.aip.org/link/?JAPIAU/99/043513/1
http://dx.doi.org/10.1063/1.2173307
URI : http://hdl.handle.net/10261/18320
ISSN: 0021-8979
DOI: 10.1063/1.2173307
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