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Magnetic Force Microscopy (MFM) probes by FEBID and their application

AuthorsPablo-Navarro, Javier; Magen, Cesar; Berganza, Eider; Jaafar, Miriam ; Asenjo Barahona, Agustina ; Teresa, José María de
Issue Date2018
CitationFEBIP 2018
DescriptionResumen del trabajo presentado al 7th International Workshop on Focused Electron Beam-Induced (FEBIP), celebrado en Modena (Italia) del 10 al 13 de julio de 2018.
Appears in Collections:(ICMA) Comunicaciones congresos
(ICMM) Comunicaciones congresos
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