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Magnetic anisotropy axis reorientation at ultrathin FePt films

AuthorsKaidatzis, Andreas; Psycharis, V.; Giannopoulos, Georgios; García-Martín, José Miguel ; Niarchos, Dimitrios
Thin films
Non-volatile memories
Magnetic anisotropy
Crystal structure
Anomalous Hall effect
Issue DateFeb-2017
PublisherJohn Wiley & Sons
CitationPhysica Status Solidi - Rapid Research Letters 11(2): 1600386 (2017)
AbstractUltrathin FePt films (thickness between 1 nm and 5 nm) were studied for non‐volatile memories applications. The films were magnetron sputtered on monocrystalline MgO⟨001⟩ substrates at 500 °C. The films are polycrystalline, except the 1 nm thick film which is not continuous. It is shown that films with thickness higher than 2.7 nm have L10 structure and perpendicular magnetic anisotropy, while a transition to in‐plane anisotropy occurs for thinner films. The out‐of‐plane coercivity drops from 16 kOe at the thicker film to 0.5 kOe at the thinner one.
Publisher version (URL)https://doi.org/10.1002/pssr.201600386
Appears in Collections:(IMN-CNM) Artículos
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