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Título: | Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes |
Autor: | Martínez Cuadrado, Nicolás Francisco CSIC; Patil, Shivprasad CSIC; Lozano, José R. CSIC; García García, Ricardo CSIC ORCID | Palabras clave: | Atomic force microscopy Silicon Elemental semiconductors Vibrational modes Surface topography |
Fecha de publicación: | 11-oct-2006 | Editor: | American Institute of Physics | Citación: | Applied Physic Letters 89, 153115 (2006) | Resumen: | The authors demonstrate that the compositional sensitivity of an atomic force microscope is enhanced by the simultaneous excitation of its first two flexural eigenmodes. The coupling of those modes by the nonlinear probe-surface interactions enables to map compositional changes in several conjugated molecular materials with a phase shift sensitivity that is about one order of magnitude higher than the one achieved in amplitude modulation atomic force microscopy. | Versión del editor: | http://link.aip.org http://dx.doi.org/10.1063/1.2360894 |
URI: | http://hdl.handle.net/10261/17931 | DOI: | 10.1063/1.2360894 | ISSN: | 0003-6951 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
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Fichero | Descripción | Tamaño | Formato | |
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Martínez, N.F. et al Appl.Phys.Lett._89_2006.pdf | 365,84 kB | Adobe PDF | Visualizar/Abrir |
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