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Título: | Europium monoxide nanocrystalline thin films with high near-infrared transparency |
Autor: | Mariscal, A. CSIC ORCID; Quesada, Adrián CSIC ORCID ; Tarazaga Martín-Luengo, A.; García García-Tuñón, Miguel Ángel ; Bonanni, A.; Fernández Lozano, José Francisco CSIC ORCID ; Serna, Rosalía CSIC ORCID | Palabras clave: | Oxygen loss Semiconductors: Near-infrared optical response Chemical and structural characterization EuO Europium monoxide Growth of non-stoichiometric oxides |
Fecha de publicación: | 21-jun-2018 | Editor: | Elsevier | Citación: | Applied Surface Science 456: 980-984 (2018) | Resumen: | Nanocrystalline textured EuO thin films are prepared by an oxygen loss process from a pure EuO bulk ceramic target through pulsed laser deposition in vacuum at room temperature. X-ray diffraction spectra evidence a well-defined diffraction peak corresponding to the EuO phase textured along the (1 1 0) direction. Analysis of the XRD peak profile indicates that the films are nanocrystalline (average crystallite size of 11 nm) with a compressive residual strain. The formation of stoichiometric EuO is further confirmed by a strong signal from Eu in the X-ray photoelectron spectra. The complex refractive index in the near infrared has been determined by spectroscopic ellipsometry and shows that the EuO films have a high transparency (k < 10) and a refractive index of 2.1. A band-gap shift of 0.25 eV is found with respect to the EuO bulk. These films, deposited by an accessible and efficient method, open a new route to produce EuO films with optical quality, suitable for NIR optoelectronic components. | Descripción: | 5 pags., 3 figs. | Versión del editor: | https://doi.org/10.1016/j.apsusc.2018.06.180 | URI: | http://hdl.handle.net/10261/171049 | DOI: | 10.1016/j.apsusc.2018.06.180 | Identificadores: | doi: 10.1016/j.apsusc.2018.06.180 issn: 0169-4332 |
Aparece en las colecciones: | (ICV) Artículos (CFMAC-IO) Artículos |
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