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dc.contributor.authorAzpeitia-Urkia, Jones_ES
dc.contributor.authorOtero, Gonzaloes_ES
dc.contributor.authorMompean, F. J.es_ES
dc.contributor.authorRuiz del Árbol, Nereaes_ES
dc.contributor.authorPalacio, Irenees_ES
dc.contributor.authorGutiérrez, A.es_ES
dc.contributor.authorGarcía-Hernández, M.es_ES
dc.contributor.authorMartín-Gago, José A.es_ES
dc.contributor.authorMunuera, C.es_ES
dc.contributor.authorLópez, María Franciscaes_ES
dc.identifier.citationGraphITA (2015)es_ES
dc.descriptionTrabajo presentado en GraphITA, celebrado en Bolonia (Italia) del 14 al 18 de septiemnbre de 2015.es_ES
dc.description.abstractThe production of high-quality graphene inexpensively and in bulk is an absolutely necessary first step for the material to ever live up to its promise in commercial applications. Among the different reported growth methods, chemical vapor deposition (CVD) and its variants with transition metal substrates has proven its ability to produce large-scale, one-atom thick graphene sheets [1-2]. Particularly attractive is the use of low carbon solubility Cu substrates for CVD graphene growth, owing to its inexpensiveness and the possibility of post-growth graphene transfer on arbitrary substrates [3]. In this work we present the growth of graphene layers by chemical vapor deposition under ultra-high vacuum conditions on polycrystalline oxygen-free Cu foils. As a carbon source, a C60 evaporator maintained at 500 C has been used. Prior to carbon evaporation the Cu foils have been treated by Ar-sputtering and thermal annealing cycles in order to clean them and promote the growth of well oriented large Cu terraces, especially suitable for LEED analysis (figure 1). C60 deposition has taken place while controlling the Cu foil temperature with an optical pyrometer. After growth is complete, sample analysis is performed with different techniques to characterize the graphene layer. In-situ LEED images show well defined Cu 111 and 100 reflections and rings corresponding to graphene in various orientations with respect to the Cu grains (figure 1). Ex- situ Atomic Force Microscopy (AFM) and Raman spectroscopy are employed to gather information on sample morphology and quality (figure 1). In order to determine the electronic band structure, angle resolved photoelectron emission measurements have been done in synchrotron facility where linear behavior of electrons near Dirac point has been observed (figure 1). We are currently optimizing graphene transfer from our samples to insulating oxide substrates with aim to determining its bandgap and macroscopic and local magnetotransport properties.es_ES
dc.titleTransforming C60 into graphene: growth, structural and electronic characterizationes_ES
dc.typecomunicación de congresoes_ES
oprm.item.hasRevisionno ko 0 false*
Appears in Collections:(ICMM) Comunicaciones congresos
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