English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/134552
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:


Optical constants of evaporation-deposited silicon monoxide films in the 7.1-800 eV photon energy range

AuthorsFernández-Perea, Mónica; Vidal-Dasilva, M. ; Larruquert, Juan Ignacio ; Aznárez, José Antonio ; Méndez, José Antonio ; Gullikson, E.; Aquila, A.; Soufli, R.
Issue Date2-Jun-2009
PublisherAmerican Institute of Physics
CitationJournal of Applied Physics 105: 113505 (2009)
AbstractThe transmittance of silicon monoxide films prepared by thermal evaporation was measured from 7.1 to 800 eV and used to determine the optical constants of the material. SiO films deposited onto C-coated microgrids in ultrahigh vacuum conditions were measured in situ from 7.1 to 23.1 eV. Grid-supported SiO films deposited in high vacuum conditions were characterized ex situ from 28.5 to 800 eV. At each photon energy, transmittance, and thickness data were used to calculate the extinction coefficient k. The obtained k values combined with data from the literature, and with interpolations and extrapolations in the rest of the electromagnetic spectrum provided a complete set of k values that was used in a Kramers-Kronig analysis to obtain the real part of the index of refraction, n. Two different sum-rule tests were performed that indicated good consistency of the data. © 2009 American Institute of Physics.
Description8 págs.; 11 figs.
Publisher version (URL)http://dx.doi.org/10.1063/1.3123768
Identifiersdoi: 10.1063/1.3123768
issn: 0021-8979
Appears in Collections:(CFMAC-IO) Artículos
(IFA) Artículos
Files in This Item:
File Description SizeFormat 
Optical.pdf898,03 kBAdobe PDFThumbnail
Show full item record
Review this work

Related articles:

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.