Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/131723
COMPARTIR / EXPORTAR:
logo share SHARE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invitar a revisión por pares abierta
Título

Influence of ice thickness on SMOS and aquarius brightness temperatures over Antarctica

AutorPablos, Miriam CSIC ORCID ; Piles, María CSIC ORCID; González Gambau, Verónica ; Camps, Adriano CSIC ORCID; Vall-llossera, Mercè
Fecha de publicación2015
EditorInstitute of Electrical and Electronics Engineers
Citación2015 IEEE International Geoscience & Remote Sensing Symposium : Proceedings: 5178-5181 (2015)
ResumenThe Dome-C region, in the East Antarctic Plateau, has been used for calibration/validation of satellite microwave radiometers since the 1970's. However, its use as an independent external target has been recently questioned due to some spatial inhomogeneities found in L-band airborne and satellite observations. This work evidences the influence of the Antarctic ice thickness spatial variations on the measured SMOS and Aquarius brightness temperatures (TB). The possible effects of subglacial water and bedrock on the acquired radiometric signals have also been analyzed. A 3-months no-daylight period during the Austral winter has been selected. Four transects over East Antarctica have been defined to study the spatial variations. A good agreement between SMOS and Aquarius TB changes and ice thickness variations over the whole Antarctica has been observed, obtaining linear correlations of 0.6-0.7 and slopes of 8.6-9.5 K/km. The subglacial lakes may affect the vertical physical temperature profile and/or the dielectric properties of the ice layers above. As expected, the subglacial bedrock is not contributing to the measured TB, since the maximum estimated L-band penetration depth is ~1-1.5 km
Descripción2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2015), Remote Sensing: Understanding the Earth for a Safer World, 26-31 July 2015, Milan, Italy.-- 4 pages, 6 figures, 1 table.-- © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Versión del editorhttps://doi.org/10.1109/IGARSS.2015.7327000
URIhttp://hdl.handle.net/10261/131723
DOI10.1109/IGARSS.2015.7327000
Identificadoresissn: 2153-6996
isbn: 978-1-4799-7929-5
Aparece en las colecciones: (ICM) Libros y partes de libros




Ficheros en este ítem:
Fichero Descripción Tamaño Formato
Pablos_et_al_2015_postprint.pdf973,28 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo

CORE Recommender

Page view(s)

233
checked on 19-abr-2024

Download(s)

152
checked on 19-abr-2024

Google ScholarTM

Check

Altmetric

Altmetric


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.