English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/11966
Title: Direct imaging of quantum wires nucleated at diatomic steps
Authors: Molina, Sergio I.; Varela, M.; Sales, D. L.; Ben, Teresa; Pizarro, J.; Galindo, P. L.; Fuster, David; González Díez, Yolanda; González Sotos, Luisa; Pennycook, S. J.
Keywords: Atomic force microscopy
III-V semiconductors
Indium compounds
Internal stresses
Molecular beam epitaxial growth
Scanning-transmission electron microscopy
Semiconductor growth
Semiconductor quantum wires
Stress relaxation
Issue Date: 2-Oct-2007
Publisher: American Institute of Physics
Citation: Applied Physics Letters 91, 143112 (2007)
Abstract: Atomic steps at growth surfaces are important heterogeneous sources for nucleation of epitaxial nano-objects. In the presence of misfit strain, we show that the nucleation process takes place referentially at the upper terrace of the step as a result of the local stress relaxation. Evidence for strain-induced nucleation comes from the direct observation by postgrowth, atomic resolution, Z-contrast imaging of an InAs-rich region in a nanowire located on the upper terrace surface of an interfacial diatomic step.
Publisher version (URL): http://dx.doi.org/10.1063/1.2790483
URI: http://hdl.handle.net/10261/11966
ISSN: 0003-6951
DOI: 10.1063/1.2790483
Appears in Collections:(IMM-CNM) Artículos
Files in This Item:
File Description SizeFormat 
Molina, S.I. et al ApplPhysLett_91_2007.pdf461,94 kBAdobe PDFThumbnail
Show full item record

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.