Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/11966
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Título: | Direct imaging of quantum wires nucleated at diatomic steps |
Autor: | Molina, Sergio I.; Varela, María; Sales, David L.; Ben, Teresa; Pizarro, J.; Galindo, P. L.; Fuster, David CSIC ORCID ; González Díez, Yolanda CSIC ORCID; González Sotos, Luisa CSIC ORCID ; Pennycook, Stephen J. | Palabras clave: | Atomic force microscopy III-V semiconductors Indium compounds Internal stresses Molecular beam epitaxial growth Nanowires Nucleation Scanning-transmission electron microscopy Self-assembly Semiconductor growth Semiconductor quantum wires Stress relaxation |
Fecha de publicación: | 2-oct-2007 | Editor: | American Institute of Physics | Citación: | Applied Physics Letters 91, 143112 (2007) | Resumen: | Atomic steps at growth surfaces are important heterogeneous sources for nucleation of epitaxial nano-objects. In the presence of misfit strain, we show that the nucleation process takes place referentially at the upper terrace of the step as a result of the local stress relaxation. Evidence for strain-induced nucleation comes from the direct observation by postgrowth, atomic resolution, Z-contrast imaging of an InAs-rich region in a nanowire located on the upper terrace surface of an interfacial diatomic step. | Versión del editor: | http://dx.doi.org/10.1063/1.2790483 http://link.aip.org |
URI: | http://hdl.handle.net/10261/11966 | DOI: | 10.1063/1.2790483 | ISSN: | 0003-6951 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
Molina, S.I. et al ApplPhysLett_91_2007.pdf | 461,94 kB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
15
checked on 16-mar-2024
WEB OF SCIENCETM
Citations
13
checked on 22-feb-2024
Page view(s)
441
checked on 18-mar-2024
Download(s)
298
checked on 18-mar-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.