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A Procedure for Alternate Test Feature Design and Selection

AuthorsBarragán, Manuel J. ; Léger, G.
Issue Date2015
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Design and Test, 32(1): 18-25 (2015(
Abstracthis paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
Publisher version (URL)http://dx.doi.org/10.1109/MDAT.2014.2361722
Appears in Collections:(IMSE-CNM) Artículos
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