2024-03-28T10:46:24Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/217402017-07-10T07:31:21Zcom_10261_98com_10261_3col_10261_351
DIGITAL.CSIC
author
Ferrer, F. J.
author
Yubero, Francisco
author
Mejías Romero, José Antonio
author
García López, J.
author
González-Elipe, Agustín R.
2010-03-01T09:57:14Z
2010-03-01T09:57:14Z
2007-10-30
Journal of Applied Physics 102(8): 084112 (2007)
0021-8979
http://hdl.handle.net/10261/21740
10.1063/1.2801402
Compact Si–Ti–O and Si–Zr–O mixed oxide thin films are studied by optical characterization (refractive index, band gap energy) and local probes (Auger parameter obtained by x-ray photoelectron spectroscopy). Interpretation of the obtained results is discussed in the framework of the classical dielectric theory that correlates the macroscopic refractive index to the microscopic electronic polarizability of each particular ion in the compound through the Lorentz-Lorenz relationship. Quantum mechanical cluster calculations have also been performed to support the correlations obtained between the experimental findings.
eng
openAccess
Auger electron spectra
Cluster approximation
Dielectric thin films
Energy gap
Refractive index
Silicon compounds
Titanium compounds
Microscopic and macroscopic dielectric description of mixed oxide thin films
artículo
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URL
https://digital.csic.es/bitstream/10261/21740/1/GetPDFServlet.pdf
File
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GetPDFServlet.pdf
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https://digital.csic.es/bitstream/10261/21740/4/GetPDFServlet.pdf.txt
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GetPDFServlet.pdf.txt