2024-03-28T09:21:04Zhttp://digital.csic.es/dspace-oai/requestoai:digital.csic.es:10261/1660042022-12-23T12:27:19Zcom_10261_28com_10261_4col_10261_281
2018-06-08T13:59:17Z
urn:hdl:10261/166004
Geometric correction factor for transepithelial electrical resistance measurements in transwell and microfluidic cell cultures
Yeste Lozano, José
Illa, Xavi
Gutiérrez, Cristina
Solé, Montse
Guimerà-Brunet, Anton
Villa, Rosa
Ministerio de Economía y Competitividad (España)
Consejo Superior de Investigaciones Científicas (España)
Jose Yeste [0000-0001-7540-7305]
Transepithelial Electrical Resistance
Electrical Impedance Spectroscopy
Interdigitated Electrodes
Microfluidics
Transwell
Geometric Correction Factor
Transepithelial electrical resistance (TEER) measurements are regularly used in in vitro models to quantitatively evaluate the cell barrier function. Although it would be expected that TEER values obtained with the same cell type and experimental setup were comparable, values reported in the literature show a large dispersion for unclear reasons. This work highlights a possible error in a widely used formula to calculate the TEER, in which it may be erroneously assumed that the entire cell culture area contributes equally to the measurement. In this study, we have numerically calculated this error in some cell cultures previously reported. In particular, we evidence that some TEER measurements resulted in errors when measuring low TEERs, especially when using Transwell inserts 12 mm in diameter or microfluidic systems that have small chamber heights. To correct this error, we propose the use of a geometric correction factor (GCF) for calculating the TEER. In addition, we describe a simple method to determine the GCF of a particular measurement system, so that it can be applied retrospectively. We have also experimentally validated an interdigitated electrodes (IDE) configuration where the entire cell culture area contributes equally to the measurement, and it also implements minimal electrode coverage so that the cells can be visualized alongside TEER analysis.
2018-06-08T13:59:17Z
2018-06-08T13:59:17Z
2016-08-18
artículo
Journal of Physics D: Applied Physics 49(37):375401 (2016)
0022-3727
http://hdl.handle.net/10261/166004
10.1088/0022-3727/49/37/375401
http://dx.doi.org/10.13039/501100003329
http://dx.doi.org/10.13039/501100003339
No
eng
Postprint
https://doi.org/10.1088/0022-3727/49/37/375401
Sí
info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/SAF2014-62114-EXP
info:eu-repo/grantAgreement/MINECO/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/DPI2015-65401-C3-3-R
http://iopscience.iop.org/page/copyright_notice
openAccess
Institute of Physics Publishing