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Browsing by Author Pineda de Gyvez, José

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Issue DateTitleAuthor(s)Type
May-2007BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated CircuitsZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, JoséComunicación de congreso
2012Digital adaptive calibration of multi-step analog to digital convertersZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, JoséArtículo
2011Introduction to the special issue on the 36th European Solid-State Circuits Conference (ESSCIRC)Rodríguez Vázquez, Angel; Leenaerts, D. M. W.; Pineda de Gyvez, JoséArtículo
6-Feb-2012Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOSZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, JoséArtículo

Showing results 1 to 4 of 4