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Browsing by Author Morilla, Yolanda

Showing results 1 to 13 of 13
RightsIssue DateTitleAuthor(s)Type
openAccess3-Nov-2006A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopyBattistig, Gabor; García López, J.; Morilla, YolandaArtículo
closedAccess13-Mar-2008Accelerator-based research activities at "Centro Nacional de Aceleradores", Seville (Spain)Respaldiza, M. A.; Ager, F. J.; Carmona, Asunción; Ferrer, F. J.; García-León, Manuel; García López, J.; García-Orellana, Isabel; Gómez-Tubío, B.; Morilla, Yolanda; Ontalba-Salamanca, M. Á.; Ortega-Feliú, I.Artículo
openAccess2009All chemical YBa2Cu3O7 superconducting multilayers: Critical role of CeO2 cap layer flatnessColl Bau, Mariona; Gázquez Alabart, Jaume; Huhne, R.; Holzapfel, B.; Morilla, Yolanda; García López, J.; Pomar Barbeito, Alberto; Sandiumenge Ortiz, Felip; Puig, T.; Obradors Berenguer, XavierArtículo
closedAccess17-Mar-2008Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometryLohner, T.; García López, J.; Morilla, YolandaArtículo
closedAccess2009Determination of nitrogen partitioning coefficients in superduplex stainless steels by NRA using a nuclear microprobeMuñoz, Concepción; Morilla, Yolanda; García López, J.; Paúl, A.; Odriozola Gordon, José AntonioArtículo
closedAccess2012Developing the IBA equipment to increase the versatility of the CNAMorilla, Yolanda; Jiménez-Ramos, M. C.; García López, J.; Labrador, J. A.; Palomo, Francisco Rogelio; Ortega-Feliú, I.Artículo
closedAccess2009Dynamic annealing study of SiC epilayers implanted with Ni ions at different temperaturesGarcía López, J.; Morilla, Yolanda; Battistig, GaborArtículo
closedAccess2011Early works on the nuclear microprobe for microelectronics irradiation tests at the CEICI (Sevilla, Spain)Palomo, Francisco Rogelio; Morilla, Yolanda; Mogollón, J. M.; García López, J.; Labrador, J. A.; Aguirre, M. A.Artículo
closedAccess2003High energy ion characterization of sputtered AlN thin filmsGarcía López, J.; Morilla, Yolanda; Respaldiza, M. A.Artículo
closedAccess2004Influence of oxygen and argon on the crystal quality and piezoelectric response of AlN sputtered thin filmsVergara, L.; García López, J.; Morilla, Yolanda; Respaldiza, M. A.Artículo
closedAccess2012Influence of the fiber coating type on the strain response of proton-irradiated fiber bragg gratingsCurras, E.; López Virto, A.; Moya, D.; Vila, Iván; Carrión, J. G.; García López, J.; Jiménez-Ramos, M. C.; Morilla, Yolanda; Palomo, Francisco RogelioArtículo
closedAccess2014Measurement of the MACS of 159Tb(n, γ) at kT=30 keV by activationPraena, J.; Mastinu, P.; Pignatari, M.; Quesada, J. M.; Capote, R.; Morilla, YolandaArtículo
closedAccess3-Dec-2007The new Cyclone 18/9 beam transport line at the CNA (Sevilla) for high energy PIXE applicationsGarcía López, J.; Ortega-Feliú, I.; Morilla, Yolanda; Ferrero, ArmandoArtículo