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DerechosFecha Public.TítuloAutor(es)
openAccess2010A BIST solution for frequency domain characterization of analog circuitsBarragán, Manuel J.; Vázquez, Diego; Rueda, Adoración
openAccess2009A BIST solution for the functional characterization of RF systems based on envelope response analysisBarragán, Manuel J.; Fiorelli, R.; Vázquez, Diego; Rueda, Adoración; Huertas-Díaz, J. L.
openAccess2015A Procedure for Alternate Test Feature Design and SelectionBarragán, Manuel J.; Leger, Gildas
openAccess6-ene-2011Alternate test of LNAs through ensemble learning of on-chip digital envelope signaturesBarragán, Manuel J.; Fiorelli, R.; Léger, G.; Rueda, Adoración; Huertas-Díaz, J. L.
openAccess8-ene-2011Analog sinewave signal generators for mixed-signal built-in test applicationsBarragán, Manuel J.; Vázquez, Diego; Rueda, Adoración
openAccess2010bellatrixBarragán, Manuel J.; Peralías, E.
openAccessmay-2007BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated CircuitsZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, José
closedAccess2012Digital adaptive calibration of multi-step analog to digital convertersZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, José
openAccess2009Efficient functional built-in test for RF systems using two-tone response envelope analysisBarragán, Manuel J.; Vázquez, Diego; Rueda, Adoración; Huertas-Díaz, J. L.
closedAccess2013Efficient selection of signatures for analog/RF alternate testBarragán, Manuel J.; Léger, G.
openAccessmay-2009Generación y evaluación on-chip de señales analógicas para aplicaciones bist de circuitos analógicos y de señal mixtaBarragán, Manuel J.
openAccess2010Guidelines for the efficient design of sinewave generators for analog/mixed-signal BISTBarragán, Manuel J.; Vázquez, Diego; Rueda, Adoración; Huertas-Díaz, J. L.
openAccess2010idusBarragán, Manuel J.; Peralías, E.
openAccessnov-2011Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAsBarragán, Manuel J.; Fiorelli, R.; Léger, G.; Rueda, Adoración; Huertas-Díaz, J. L.
openAccessmay-2010Low-cost signature test of RF blocks based on envelope response analysisBarragán, Manuel J.; Fiorelli, R.; Vázquez, Diego; Rueda, Adoración; Huertas-Díaz, J. L.
closedAccess6-feb-2012Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOSZjajo, Amir; Barragán, Manuel J.; Pineda de Gyvez, José
openAccess2009menkarBarragán, Manuel J.; Peralías, E.
openAccess3-ene-2013Method and system for testing integrated radio-frecuency circuits at the wafer level and the use thereofHuertas-Díaz, J. L.; Barragán, Manuel J.
openAccess11-feb-2013Método y sistema de testado de circuitos integrados de radiofrecuencia a nivel de oblea y su usoHuertas-Díaz, J. L.; Barragán, Manuel J.
openAccessabr-2012Multi-condition alternate test of analog, mixed-signal, and RF systemsBarragán, Manuel J.; Léger, G.; Huertas-Díaz, J. L.