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| Rights | Preview | Issue Date | Title | Author(s) | Type |
| openAccess |  | 2010 | A BIST solution for frequency domain characterization of analog circuits | Barragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID | artículo |
| openAccess |  | 2009 | A BIST solution for the functional characterization of RF systems based on envelope response analysis | Barragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | comunicación de congreso |
| closedAccess |  | 2022 | A methodology for defect detection in analog circuits based on causal feature selection | Leger, Gildas CSIC ORCID ; Ginés, Antonio J. CSIC ORCID; Gutiérrez, Valentín CSIC ORCID; Barragán, Manuel J. CSIC ORCID | comunicación de congreso |
| openAccess |  | 2015 | A Procedure for Alternate Test Feature Design and Selection | Barragán, Manuel J. CSIC ORCID; Leger, Gildas CSIC ORCID | artículo |
| openAccess |  | 6-Jan-2011 | Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures | Barragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | artículo |
| openAccess |  | 8-Jan-2011 | Analog sinewave signal generators for mixed-signal built-in test applications | Barragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID | artículo |
| openAccess |  | 2010 | bellatrix | Barragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID | topografía de productos semiconductores |
| openAccess |  | May-2007 | BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits | Zjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, José | comunicación de congreso |
| closedAccess; openAccess |  | Sep-2016 | Brownian distance correlation-directed search: A fast feature selection technique for alternate test | Leger, Gildas CSIC ORCID ; Barragán, Manuel J. CSIC ORCID | artículo |
| openAccess |  | 2019 | Defect filter construction [Dataset] | Leger, Gildas CSIC ORCID ; Ginés, Antonio J. CSIC ORCID; Gutiérrez, Valentín CSIC ORCID; Barragán, Manuel J. CSIC ORCID | dataset |
| closedAccess |  | 2012 | Digital adaptive calibration of multi-step analog to digital converters | Zjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, José | artículo |
| openAccess |  | 2009 | Efficient functional built-in test for RF systems using two-tone response envelope analysis | Barragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | comunicación de congreso |
| closedAccess |  | 2013 | Efficient selection of signatures for analog/RF alternate test | Barragán, Manuel J. CSIC ORCID; Leger, Gildas CSIC ORCID | comunicación de congreso |
| openAccess |  | May-2009 | Generación y evaluación on-chip de señales analógicas para aplicaciones bist de circuitos analógicos y de señal mixta | Barragán, Manuel J. CSIC ORCID | tesis doctoral |
| openAccess |  | 2010 | Guidelines for the efficient design of sinewave generators for analog/mixed-signal BIST | Barragán, Manuel J. CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | comunicación de congreso |
| openAccess |  | 2010 | idus | Barragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID | topografía de productos semiconductores |
| openAccess |  | Nov-2011 | Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAs | Barragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | comunicación de congreso |
| openAccess |  | May-2010 | Low-cost signature test of RF blocks based on envelope response analysis | Barragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC | comunicación de congreso |
| closedAccess | | 6-Feb-2012 | Low-power die-level process variation and temperature monitors for yield analysis and optimization in deep-submicron CMOS | Zjajo, Amir; Barragán, Manuel J. CSIC ORCID; Pineda de Gyvez, José | artículo |
| openAccess |  | 2009 | menkar | Barragán, Manuel J. CSIC ORCID; Peralías, E. CSIC ORCID | topografía de productos semiconductores |
