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Browsing by Author Andrés, Nieves

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Showing results 1 to 7 of 7
RightsPreviewIssue DateTitleAuthor(s)Type
openAccessdigital speckle.pdf.jpg2013Application of digital speckle interferometry to visualize surface changes in metallic samples immersed in Cu(NO3)2 solutionsAndrés, Nieves; Andres-Arroyo, Ana; Arroyo, M. Pilar; Palero, Virginia R.; Lobera, Julia; Angurel, Luis A.Artículo
openAccessCAPITULOS_DE_LIBROS309615[1].pdf.jpgAug-2010Application of Optical Techniques in the Characterization of Thermal Stability and Environmental Degradation in High Temperature SuperconductorsAngurel, Luis A.; Andrés, Nieves; Arroyo, M. Pilar; Recuero, S.; Martínez, Elena; Pelegrín, J.; Lera, F.; Andrés Gimeno, José Manuel Capítulo de libro
openAccessChanges in the thermal stability.pdf.jpg2011Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layerAngurel, Luis A.; Martínez, Elena; Pelegrín, J.; Lahoz, Ruth; Fuente, Germán F. de la; Andrés, Nieves; Arroyo, M. PilarArtículo
closedAccess16-Aug-2006Laser technologies applied to the fabrication and characterization of bulk Bi-2212 superconducting materials for power applicationsAngurel, Luis A.; Diez, J. C.; Fuente, Germán F. de la; Gimeno, F.; Lera, F.; López-Gascón, Clarisa; Martínez, Elena; Mora Alfonso, Mario; Navarro, Rafael; Sotelo, A.; Andrés, Nieves; Recuero, S.; Arroyo, M. PilarArtículo
closedAccessaccesoRestringido.pdf.jpg2013Possibilities and limitations of digital speckle pattern interferometry in the analysis of corrosion processes in metallic materialsAndres-Arroyo, Ana; Andrés, Nieves; Palero, Virginia R.; Arroyo, M. Pilar; Angurel, Luis A.Artículo
closedAccessrestringido.pdf.jpg2011Two-dimensional quantification of the corrosion process in metal surfaces using digital speckle pattern interferometryAndrés, Nieves; Lobera, Julia; Arroyo, M. Pilar; Angurel, Luis A.Artículo
closedAccessARCHIVO COMODIN DIGITAL CSIC.pdf.jpg28-Apr-2008Visualisation of environmental degradation in ceramic superconductors using digital speckle photographyRecuero, S.; Bona, M.T.; Andrés, Nieves; Andrés Gimeno, José Manuel ; Angurel, Luis A.Artículo