Mostrando resultados 6 a 25 de 51
< Anterior
Siguiente >
Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
openAccess | | 30-mar-2017 | CNA facility for testing electronics | Morilla, Yolanda CSIC ORCID | comunicación de congreso |
closedAccess | | 17-mar-2008 | Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometry | Lohner, T.; García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
closedAccess | | 2009 | Determination of nitrogen partitioning coefficients in superduplex stainless steels by NRA using a nuclear microprobe | Muñoz, Concepción; Morilla, Yolanda CSIC ORCID; García López, J. CSIC ORCID; Paúl, A.; Odriozola, José Antonio CSIC ORCID | artículo |
closedAccess | | 2012 | Developing the IBA equipment to increase the versatility of the CNA | Morilla, Yolanda CSIC ORCID; Jiménez-Ramos, M. C. CSIC ORCID; García López, J. CSIC ORCID; Labrador, J. A. CSIC; Palomo, Francisco Rogelio; Ortega-Feliú, I. CSIC | artículo |
closedAccess | | 2009 | Dynamic annealing study of SiC epilayers implanted with Ni ions at different temperatures | García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Battistig, Gabor | artículo |
closedAccess | | 2011 | Early works on the nuclear microprobe for microelectronics irradiation tests at the CEICI (Sevilla, Spain) | Palomo, Francisco Rogelio; Morilla, Yolanda CSIC ORCID; Mogollón, J. M.; García López, J. CSIC ORCID; Labrador, J. A. CSIC; Aguirre, M. A. | artículo |
openAccess | | oct-2023 | Effect of ionizing radiation on quasi-floating gate transistors | Luján-Martínez, Clara; Hinojo-Montero, José; Muñoz, Fernando; Palomo, Francisco Rogelio; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
openAccess | | 2020 | Empirical mathematical model of microprocessor sensitivity and early prediction to proton and neutron radiation-induced soft errors | Serrano-Cases, A.; Reyneri, L. M.; Morilla, Yolanda CSIC ORCID; Cuenca-Asensi, Sergio; Martínez-Álvarez, A. | artículo |
openAccess | | 16-sep-2018 | Error detection through trace infrastructure in ARM microprocessors | Peña-Fernandez, M.; Lindoso, Almudena; Entrena, Luis A.; García-Valderas, Mario; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | póster de congreso |
closedAccess | | ago-2023 | Evaluating Reduced Resolution Redundancy for Radiation Hardening in FPGA Designs | García-Astudillo, Luis A.; Lindoso, Almudena; Entrena, Luis A.; Martín, Honorio; García-Valderas, Mario; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID | artículo |
openAccess | | 2020 | Evaluation of a COTS 65-nm SRAM under 15 MeV protons and 14 MeV neutrons at low VDD | Rezaei, Mohammadreza; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Franco, Francisco J.; Fabero, Juan Carlos; Mecha, Hortensia; Puchner, Helmut; Hubert, Guillaume; Clemente, Juan Antonio | artículo |
closedAccess | | 5-abr-2018 | Evaluation of the suitability of NEON SIMD microprocessor extensions under proton irradiation | Lindoso, Almudena; García-Valderas, Mario; Entrena, Luis A.; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | artículo |
closedAccess | | 2-oct-2017 | Evaluation of the suitability of SIMD microprocessor extensions in radiation environments | Lindoso, Almudena; García-Valderas, Mario; Entrena, Luis A.; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID | póster de congreso |
openAccess | | 2-oct-2017 | Farmer chamber response to different filter box and surrounding configurations | Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Domínguez, Manuel; Fernandez, G. | póster de congreso |
closedAccess | | 2003 | High energy ion characterization of sputtered AlN thin films | García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Respaldiza, M. A. CSIC ORCID | artículo |
closedAccess | | 2022 | How the analysis of archival data could provide helpful information about TID degradation. Case study: Bipolar transistors | Martín Holgado, Pedro CSIC ORCID; Romero-Maestre, Amor; Martín Hernández, José de; González-Luján, José J.; Illera-Gómez, Iván; Jiménez-de-Luna, Yolanda; Morilla, Fernando; Sacristán Barbero, Mario; García Alía, Rubén; Domínguez, Manuel; Morilla, Yolanda CSIC ORCID | artículo |
closedAccess | | 2022 | Hybrid lockstep technique for soft error mitigation | Peña-Fernandez, M.; Serrano-Cases, A.; Lindoso, Almudena; Cuenca-Asensi, Sergio; Entrena, Luis A.; Morilla, Yolanda CSIC ORCID; Martín Holgado, Pedro CSIC ORCID; Martínez-Álvarez, A. | artículo |
closedAccess | | 5-ene-2022 | Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation | Rezaei, Mohammadreza; Hubert, Guillaume; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Fabero, Juan Carlos; Mecha, Hortensia; Franco, Francisco J.; Puchner, Helmut; Clemente, Juan Antonio | artículo |
openAccess | | 28-ago-2019 | Impact of gamma radiation on dynamic RDSON characteristics in AlGaN/GaN power HEMTs | Martínez, Pedro J. CSIC ORCID; Maset, Enrique; Martín Holgado, Pedro CSIC ORCID; Morilla, Yolanda CSIC ORCID; Gilabert, David; Sanchis-Kilders, Esteban | artículo |
closedAccess | | 2004 | Influence of oxygen and argon on the crystal quality and piezoelectric response of AlN sputtered thin films | Vergara, L. CSIC; García López, J. CSIC ORCID; Morilla, Yolanda CSIC ORCID; Respaldiza, M. A. CSIC ORCID | artículo |