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Navegación por Autor Fiorelli, Rafaella

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DerechosPreviewFecha Public.TítuloAutor(es)Tipo
openAccessRF alternate.pdf.jpgnov-2011Improving the accuracy of RF alternate test using multi-VDD conditions: application to envelope-based test of LNAsBarragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Leger, Gildas CSIC ORCID ; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSICcomunicación de congreso
openAccesslc_vco.pdf.jpg2011LC-VCO design optimization methodology based on the gm/ID ratio for nanometer CMOS technologiesFiorelli, Rafaella CSIC ORCID; Peralías, E. CSIC ORCID ; Silveira, Fernandoartículo
openAccessLow-cost signature.pdf.jpgmay-2010Low-cost signature test of RF blocks based on envelope response analysisBarragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSICcomunicación de congreso
openAccessMOST Moderate.pdf.jpg2014MOST moderate-weak-inversion region as the optimum design zone for CMOS 2.4-GHz CS-LNAsFiorelli, Rafaella CSIC ORCID; Silveira, Fernando; Peralías, E. CSIC ORCID artículo
openAccessCSSP-2019_Fiorelli_et_al.pdf.jpg2020Normalized Nonlinear Semiempirical MOST Model Used in Monolithic RF Class A-to-C PAsFiorelli, Rafaella CSIC ORCID; Barabino, Nicolás; Silveira, F.; Peralías, E. CSIC ORCID artículo
openAccessOffset_calibration_in_Time_Domain_Comparator_Using_Inversion_mode_Varactors.pdf.jpg2020Offset-Calibration with Time-Domain Comparators Using Inversion-Mode VaractorsFiorelli, Rafaella CSIC ORCID; Delgado-Restituto, Manuel CSIC ORCID; Rodríguez-Vázquez, Ángel CSIC ORCIDartículo
openAccessOn-chip characterization.pdf.jpgene-2010On-chip characterization of RF systems based on envelope response analysisBarragán, Manuel J. CSIC ORCID; Fiorelli, Rafaella CSIC ORCID; Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSICartículo
openAccessSemi-empirical model.pdf.jpg2012Semi-empirical model of MOST and passive devices focused on narrowband RF blocksFiorelli, Rafaella CSIC ORCID; Silveira, Fernando; Rueda, Adoración CSIC ORCID; Peralías, E. CSIC ORCID comunicación de congreso
openAccessfiorelli_semi.pdf.jpg2016Semi-empirical RF MOST model for CMOS 65 nm technologies: theory, extraction method and validationFiorelli, Rafaella CSIC ORCID; Peralías, E. CSIC ORCID artículo
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